Process Quality Control: Troubleshooting and Interpretation of Data - Couverture rigide

Ott, Ellis; Schilling, Edward; Neubauer, Dean

Couverture rigide

ISBN 10 : 0071350101 ISBN 13 : 9780071350105

Editeur : McGraw-Hill Professional, 2000

Synopsis

This work aims to help readers learn a systematic approach to gathering and analyzing data for a particular process which is malfunctioning, be it technical, electrical, chemical or some other type of process.

A propos du livre

À propos des auteurs

The late Ellis R. Ott was Professor Emeritus of Experimental Statistics at Rutgers, The State University of New Jersey, and the Founding Director of the Rutgers Statistics Center. He received his Ph.D. from the University of Illinois. He consulted extensively including work with the U.S. State Department and the United Nations. Dr. Ott was the recipient of numerous quality control awards, including honorary member of the American Society for Quality and its Brumbaugh Award, the Eugene L. Grant Award, and the Shewhart Medal. He was honored by an award established in his name by the Metropolitan Section of ASQC.

Dr. Edward G. Schilling is Professor of Statistics and Director of the Center for Quality and Applied Statistics in the College of Engineering at Rochester Institute of Technology. He was previously manager of the Lighting Quality Operation of the General Electric Company. He received his M.S. and Ph.D. degrees in statistics from Rutgers University, where he studied under Ellis Ott. Dr. Schilling is a fellow of the American Statistical Association and the American Society for Quality, and is the first person to win the American Society for Qualitys Brumbaugh Award four times. He is also a recipient of the Shewhart Medal the Ellis R. Ott Award. He is the author of the Acceptance Sampling Quality Control and was Associate Editor of the 5th Edition of Jurans Quality Handbook.

Dean V. Neubauer is employed at Corning Incorporated where he holds the appointed position of Engineering Associate-Statistical Engineering. He is also a member of the adjunct faculty in the Center for Quality and Applied Statistics in the College of Engineering at Rochester Institute of Technology. Mr. Neubauer received his B.S. degree in Statistics from Iowa State University and a M.S. degree in Applied and Mathematical Statistics from Rochester Institute of Technology. He holds two U.S. patents and is an active member of ISO and ASTM standards committees. He is a Fellow and a Charter Statistician of the Royal Statistical Society, a Senior Member and Certified Quality Engineer of the American Society for Quality, and a member of the American Statistical Association.

Détails de l'édition

• Éditeur: McGraw-Hill Professional
• Date d'édition: 2000
• ISBN 10: 0071350101
• ISBN 13: 9780071350105
• Reliure: Relié
• Langue: anglais
• Numéro d'édition: 3
• Nombre de pages: 500
• Coordonnées du fabricant: non disponible