Waveguide Spectroscopy of Thin Films, Volume 33 - Couverture souple

Khomchenko, A. V.

9780123991973: Waveguide Spectroscopy of Thin Films, Volume 33

Couverture souple

ISBN 10 : 0123991978 ISBN 13 : 9780123991973

Editeur : Academic Press, 2012

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Biographie de l'auteur :

A.V. Khomchenko is D.Sc. in Physics and Mathematics (from Stepanov Institute of Physics, Minsk, Belarus). His research interests are in integrated optics, surface and interfaces physics, optical waveguides, testing of linear and nonlinear optical parameters of thin films. Alexander V. Khomchenko was born in Gomel, Belarus, on Mart 23, 1957. He received the Ph.D. degrees in optics and D.Sc. in Physics and Mathematics from Stepanov Institute of Physics, Minsk, Belarus, in 1990 and 2003, respectively. He became a Senior Researcher in 1990, an Scientific Secretary in 1991 and Head of Laboratory of optoelectronic devices 2003, at the Institute of Applied Optics of Natioal Academy of Sciences, Mogilev, Belarus. He is currently a Visiting Professor at Belarus-Russian University, Mogilev, Belarus. His research interests are in integrated optics, surface and interfaces physics, optical waveguides, testing of linear and nonlinear optical parameters of thin films. Dr. A.V. Khomchenko is a member of the Belarus Physical Society and the Rozhdestvensky Optical Society - OSR.

Pr�sentation de l'�diteur :

In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties.

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