This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.Revue de presse :
The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level. ( T. Mulvey, Measurement Science Technology 8 (1997))
For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields. ( Aslib Book Guide, vol.61, no.12, December 1996.)
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Description du livre Oxford Univ Pr on Demand, 1996. Hardcover. État : Brand New. 509 pages. 9.75x6.75x1.25 inches. In Stock. N° de réf. du libraire zk0198513879
Description du livre Oxford University Press, 1996. Hardcover. État : New. book. N° de réf. du libraire 0198513879