Articles liés à Scanning Electron Microscopy and X-Ray Microanalysis
Synopsis
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.
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À propos de l?auteur
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Springer, 2003
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Scanning Electron Microscopy a
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Springer, 2003
ISBN 10 : 0306472929
ISBN 13 : 9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis
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Springer Nature Singapore Jan 2003, 2003
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. 689 pp. Englisch. N° de réf. du vendeur 9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Edité par
Springer, 2003
ISBN 10 : 0306472929
ISBN 13 : 9780306472923
Ancien ou d'occasion
Couverture rigide
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Hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_425916348
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Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and 'through-the-lens' detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping. N° de réf. du vendeur 9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Etat : New. pp. xix + 689 3rd Edition. N° de réf. du vendeur 26282534
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Scanning Electron Microscopy and X-Ray Microanalysis
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Etat : New. pp. xix + 689 232 Illus. N° de réf. du vendeur 7598201
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Scanning Electron Microscopy and X-Ray Microanalysis
impression à la demandeVendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Etat : New. PRINT ON DEMAND pp. xix + 689. N° de réf. du vendeur 18282540
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Springer, 2007
ISBN 10 : 0306472929
ISBN 13 : 9780306472923
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Hardcover. Etat : Like New. Like New. book. N° de réf. du vendeur ERICA77503064729296
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