Applied Reliability - Couverture rigide

Tobias, Paul A.; Trindade, David C.

Couverture rigide

ISBN 10 : 0442283105 ISBN 13 : 9780442283100

Editeur : Van Nost.Reinhold,U.S., 1987

Synopsis

Book by Tobias Paul A

A propos du livre

Présentation de l'éditeur

With over 170 pages of new material, the second edition of this widely used reference provides engineers and statisticians with an updated, easy-to-follow approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced leading-edge reliability techniques. It includes an extensive treatment of life distribution and accelerated testing models and data analysis and data simulation techniques, as well as quality control methods and algorithms used to predict component and assembly field reliability.

The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs.

In addition, this latest edition offers hundreds of new examples, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods.

In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control.

Biographie de l'auteur

Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society’s Lifetime Achievement Award.

Détails de l'édition

• Éditeur: Van Nost.Reinhold,U.S.
• Date d'édition: 1987
• ISBN 10: 0442283105
• ISBN 13: 9780442283100
• Reliure: Relié
• Langue: anglais
• Nombre de pages: 256
• Coordonnées du fabricant: non disponible