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9780471486404: X-Ray Spectrometry: Recent Technological Advances
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X-ray Spectrometry Covers the developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. This title includes the advanced and high-tech aspects of the chemical analysis techniques based on x-rays. It introduces various types of X-ray optics and X-ray detectors, covering history, principles, characteristics and trends. Full description

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Quatrième de couverture :
During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray spectrometry. This progress includes considerable technological improvements in the design and production of detectors as well as significant advances in x–ray optics, special configurations and computing approaches. All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future.

The book is divided into the following sections:

  • Introduction
  • X–Ray Sources
  • X–Ray Optics
  • X–Ray Detectors
  • Special Configurations
  • New Computerization Methods
  • New Applications

each covering the most advanced and high–tech aspects of the chemical analysis techniques based on x–rays. By its nature, such a book cannot cover the fundamental, well–known and more routine aspects of the technique; for this, reference is made to seve ral existing handbooks and textbooks. Each chapter is prepared by internationally recognized scientists, all of whom are eminent specialists in each of the sub–fields.

This book will assist all analytical chemists and other users of x–ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

Présentation de l'éditeur :
X–Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x–ray spectrometry.
  • Includes the most advanced and high–tech aspects of the chemical analysis techniques based on x–rays
  • Introduces new types of X–ray optics and X–ray detectors, covering history, principles, characteristics and future trends
  • Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub–fields
  • Sections include: X–Ray Sources, X–Ray Optics, X–Ray Detectors, Special Configurations, New Computerization Methods, New Applications

This valuable book will assist all analytical chemists and other users of x–ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

  • ÉditeurJohn Wiley & Sons Inc
  • Date d'édition2004
  • ISBN 10 047148640X
  • ISBN 13 9780471486404
  • ReliureRelié
  • Nombre de pages616
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Tsuji, K.
Edité par John Wiley & Sons (2004)
ISBN 10 : 047148640X ISBN 13 : 9780471486404
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Description du livre Gebunden. Etat : New. During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray spectrometry. This progress includes considerable technological improvements in the design and production of detectors as. N° de réf. du vendeur 556561451

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