Articles liés à Ionizing Radiation Effects in Mos Devices and Circuits
Synopsis
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
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À propos de l?auteur
T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Ionizing Radiation Effects in MOS Devices and Circuits
Edité par
Wiley-Interscience Publishing, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits
Edité par
Wiley-Interscience, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits
Edité par
Wiley-Interscience, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
Ancien ou d'occasion
Couverture rigide
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Ionizing Radiation Effects in MOS Devices and Circuits
Edité par
Wiley-Interscience Publishing, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
Ancien ou d'occasion
Couverture rigide
Vendeur : Salish Sea Books, Bellingham, WA, Etats-Unis
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Etat : Good. Good++ in a Very Good dust jacket; Hardcover; Dust jacket is clean and intact with no tears, just moderate edgewear, and has not been price-clipped (Now fitted with a new, Brodart jacket protector); Unblemished textblock edges; Name inside the front cover; Light pen markings to just three pages, otherwise the endpapers and all text pages are clean and unmarked; The binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 2.1 lbs; Tan dust jacket with title in red lettering; 1989, Wiley-Interscience Publishing; 608 pages; "Ionizing Radiation Effects in MOS Devices and Circuits," by T. P. Ma & Paul V. Dressendorfer. N° de réf. du vendeur SKU-0068AD01108153
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Ionizing Radiation Effects in MOS Devices and Circuits
Edité par
Wiley-Interscience, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits
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Wiley-Interscience, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits (Hardcover)
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John Wiley & Sons Inc, New York, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
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Hardcover. Etat : new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780471848936
Quantité disponible : 1 disponible(s)
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Ionizing Radiation Effects in MOS Devices and Circuits (Hardcover)
Edité par
John Wiley & Sons Inc, New York, 1989
ISBN 10 : 047184893X
ISBN 13 : 9780471848936
Neuf
Couverture rigide
Edition originale
Vendeur : AussieBookSeller, Truganina, VIC, Australie
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. N° de réf. du vendeur 9780471848936
Quantité disponible : 1 disponible(s)