Articles liés à Optical Metrology
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Book by G229svik Kjell J
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Quatrième de couverture :
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
Features include:
∗ A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
∗ Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
∗ Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
∗ Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
∗ A revised chapter on digital image processing, including noise suppression, edge– and fringe detection with sub–pixel accuracy, the DFT and the FFT.
∗ End–of–chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self–contained guide to all of the main optical metrology techniques in use today.
Présentation de l'éditeur :
Features include:
∗ A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
∗ Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
∗ Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
∗ Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
∗ A revised chapter on digital image processing, including noise suppression, edge– and fringe detection with sub–pixel accuracy, the DFT and the FFT.
∗ End–of–chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self–contained guide to all of the main optical metrology techniques in use today.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre–Bragg sensors, and temporal phase unwrapping.
∗ New introductory sections to all chapters.
∗ Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
∗ Thorough coverage of the CCD camera.
∗ New introductory sections to all chapters.
∗ Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
∗ Thorough coverage of the CCD camera.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurJohn Wiley & Sons Ltd
- Date d'édition1995
- ISBN 10 0471954748
- ISBN 13 9780471954743
- ReliureRelié
- Numéro d'édition2
- Nombre de pages300
Acheter D'occasion
état : SatisfaisantThis is an ex-library book and... En savoir plus sur cette édition
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Image d'archives
Optical Metrology
Edité par
John Wiley and Sons
(1995)
ISBN 10 : 0471954748
ISBN 13 : 9780471954743
Ancien ou d'occasion
Couverture rigide
Quantité disponible : 1
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Evaluation vendeur
Description du livre Etat : Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,850grams, ISBN:9780471954743. N° de réf. du vendeur 9952425
Acheter D'occasion
EUR 50,80
Autre devise
Image d'archives
Optical Metrology
Edité par
John Wiley & Sons Ltd 01.07.1996.
(1996)
ISBN 10 : 0471954748
ISBN 13 : 9780471954743
Ancien ou d'occasion
Couverture rigide
Quantité disponible : 1
Vendeur :
Evaluation vendeur
Description du livre Etat : Gut. Auflage: Subsequent. 300 Seiten Mit altersbedingten Lager- und Gebrauchsspuren. Bibliotheksex. E-K217 Sprache: Englisch Gewicht in Gramm: 734 17,3 x 2,6 x 25,0 cm, Gebundene Ausgabe. N° de réf. du vendeur 124027
Acheter D'occasion
EUR 52,15
Autre devise