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Description du livre Etat : New. Brand New. N° de réf. du vendeur 9780486450285
Description du livre Etat : New. N° de réf. du vendeur 4095243-n
Description du livre Paperback or Softback. Etat : New. A User's Guide to Ellipsometry 0.66. Book. N° de réf. du vendeur BBS-9780486450285
Description du livre Etat : New. Brand New! Not Overstocks or Low Quality Book Club Editions! Direct From the Publisher! We're not a giant, faceless warehouse organization! We're a small town bookstore that loves books and loves it's customers! Buy from Lakeside Books!. N° de réf. du vendeur OTF-S-9780486450285
Description du livre Etat : New. N° de réf. du vendeur ABLIING23Feb2215580229785
Description du livre Etat : New. Book is in NEW condition. 0.65. N° de réf. du vendeur 0486450287-2-1
Description du livre Etat : New. New! This book is in the same immaculate condition as when it was published. N° de réf. du vendeur 353-0486450287-new
Description du livre Etat : New. N° de réf. du vendeur I-9780486450285
Description du livre Paperback. Etat : new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780486450285
Description du livre Etat : New. . N° de réf. du vendeur 52GZZZ00ORYM_ns