Next Generation Halt and Hass: Robust Design of Electronics and Systems - Couverture rigide

Livre 8 sur 19: Quality and Reliability Engineering

Gray, Kirk A.; Paschkewitz, John J.

 
9781118700235: Next Generation Halt and Hass: Robust Design of Electronics and Systems
Couverture rigide
ISBN 10 : 1118700236 ISBN 13 : 9781118700235
Editeur : John Wiley & Sons Inc, 2016

Synopsis

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS

A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions.

The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques.

The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described.

Key features:

  • Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.
  • Challenges existing failure prediction methodologies by highlighting their limitations using real field data.
  • Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.
  • Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.
  • Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.
  • Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l?auteur

Kirk A. Gray, Accelerated Reliability Solutions, LLC, Colorado, USA

John J. Paschkewitz, Product Assurance Engineering, LLC, Missouri, USA

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
John Wiley & Sons Inc
Date d'édition
2016
Langue
anglais
ISBN 10 
1118700236
ISBN 13 
9781118700235
Reliure
Relié
Nombre de pages
296
Coordonnées du fabricant
non disponible
Personne responsable
non disponible