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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis - Couverture souple
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Présentation de l'éditeur :
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al. it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation 'recipes' Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This authoritative yet practical Handbook is an essential reference for anyone who uses these instruments, and assumes only an elementary knowledge of preparation techniques to guide the reader through the specific protocols.
Biographie de l'auteur :
Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.
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- ÉditeurSpringer
- Date d'édition2010
- ISBN 10 1441946748
- ISBN 13 9781441946744
- ReliureBroché
- Nombre de pages344
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Springer US Nov 2010
(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
Neuf
Taschenbuch
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Description du livre Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. 344 pp. Englisch. N° de réf. du vendeur 9781441946744
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Edité par
Springer US
(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
Neuf
Couverture souple
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Description du livre Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Identifies problems that all specimens present in examining their structure and analysis in the SEMDescribes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identifiedGuides the reader t. N° de réf. du vendeur 4175007
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
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Description du livre Etat : New. Book is in NEW condition. N° de réf. du vendeur 1441946748-2-1
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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ISBN 13 : 9781441946744
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Description du livre Etat : New. pp. XII + 330. N° de réf. du vendeur 263067095
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Edité par
Springer US
(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
Neuf
Taschenbuch
Quantité disponible : 1
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Evaluation vendeur
Description du livre Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. N° de réf. du vendeur 9781441946744
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
Neuf
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Description du livre Etat : New. Print on Demand pp. XII + 330 159 Illus. (Col.). N° de réf. du vendeur 5862152
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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(2010)
ISBN 10 : 1441946748
ISBN 13 : 9781441946744
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Description du livre Paperback. Etat : Brand New. 342 pages. 9.90x6.90x0.90 inches. In Stock. N° de réf. du vendeur 1441946748
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