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Description du livre Soft Cover. Etat : new. N° de réf. du vendeur 9781441952875
Description du livre Etat : New. N° de réf. du vendeur ABLIING23Mar2411530296656
Description du livre Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art. 224 pp. Englisch. N° de réf. du vendeur 9781441952875
Description du livre Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. N° de réf. du vendeur ria9781441952875_lsuk
Description du livre Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state. N° de réf. du vendeur 4175611
Description du livre Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They work at extremely low voltages and switch at very high frequencies. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality. Along with the ongoing trend towards more advanced technology and circuit features, major testing challenges are continuously emerging. The use of ambivalent procedures to test the analogue and digital sections of such complex circuits without interfering in their nominal operation is clearly a critical part of today's technological ipdustries. Chapter 1 presents the general purposes and basic concepts rel~ted With' the'testing of integrated circuits, discussing the various strategies and their limitations. Readers who are already familiar with the field may opt to skip this chapter. This book offers a multidisciplinary focus on thermal testing. This is a testing method which is not only suitable for use in combination with other existing techniques, but is also backed by a wealth of knowledge and offers exciting opportunities in the form of as yet unexplored areas of research and innovation for industrial applications. N° de réf. du vendeur 9781441952875
Description du livre Paperback. Etat : Brand New. 224 pages. 9.20x6.10x0.60 inches. In Stock. N° de réf. du vendeur x-144195287X
Description du livre Etat : New. Num Pages: 204 pages, 102 black & white illustrations, biography. BIC Classification: TDP; TJFC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 12. Weight in Grams: 349. . 2011. Softcover reprint of the original 1st ed. 2002. Paperback. . . . . N° de réf. du vendeur V9781441952875
Description du livre Paperback / softback. Etat : New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. N° de réf. du vendeur C9781441952875
Description du livre Etat : New. Num Pages: 204 pages, 102 black & white illustrations, biography. BIC Classification: TDP; TJFC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 12. Weight in Grams: 349. . 2011. Softcover reprint of the original 1st ed. 2002. Paperback. . . . . Books ship from the US and Ireland. N° de réf. du vendeur V9781441952875