Modern EMC Analysis Techniques II: Models and Applications - Couverture souple

Kantartzis, Nikolaos V.

Couverture souple

ISBN 10 : 1598293206 ISBN 13 : 9781598293203

Editeur : Morgan and Claypool Publishers, 2008

Synopsis

The objective of this two-volume book is the systematic and comprehensive description of the most competitive time-domain computational methods for the efficient modeling and accurate solution of modern real-world EMC problems. Intended to be self-contained, it performs a detailed presentation of all well-known algorithms, elucidating on their merits or weaknesses, and accompanies the theoretical content with a variety of applications. Outlining the present volume, numerical investigations delve into printed circuit boards, monolithic microwave integrated circuits, radio frequency microelectromechanical systems as well as to the critical issues of electromagnetic interference, immunity, shielding, and signal integrity. Biomedical problems and EMC test facility characterizations are also thoroughly covered by means of diverse time-domain models and accurate implementations. Furthermore, the analysis covers the case of large-scale applications and electrostatic discharge problems, while special attention is drawn to the impact of contemporary materials in the EMC world, such as double negative metamaterials, bi-isotropic media, and several others. Table of Contents: Introduction / Printed Circuit Boards in EMC Structures / Electromagnetic Interference, Immunity, Shielding, and Signal Integrity / Bioelectromagnetic Problems: Human Exposure to Electromagnetic Fields / Time-Domain Characterization of EMC Test Facilities / Large-Scale EMC and Electrostatic Discharge Problems / Contemporary Material Modeling in EMC Applications

Détails de l'édition

• Éditeur: Morgan and Claypool Publishers
• Date d'édition: 2008
• Langue: anglais
• ISBN 10: 1598293206
• ISBN 13: 9781598293203
• Reliure: Broché
• Nombre de pages: 238
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible