Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

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9781908979629: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects
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This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.

Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Revue de presse :

The scientific level of the book is excellent. I recommend this book to scientists interested in understanding the state of the art in characterizing local crystal structures and defects using X-ray micro-diffraction. --Journal of Applied Crystallography

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Edité par Imperial College Press, United Kingdom (2014)
ISBN 10 : 1908979623 ISBN 13 : 9781908979629
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Description du livre Imperial College Press, United Kingdom, 2014. Hardback. État : New. 234 x 155 mm. Language: English . Brand New Book. This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating. N° de réf. du libraire AAZ9781908979629

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Edité par Imperial College Press, United Kingdom (2014)
ISBN 10 : 1908979623 ISBN 13 : 9781908979629
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Description du livre Imperial College Press, United Kingdom, 2014. Hardback. État : New. 234 x 155 mm. Language: English . Brand New Book. This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating. N° de réf. du libraire AAZ9781908979629

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Barabash, Rozaliya (EDT)/ Ice, Gene (EDT)
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Description du livre Imperial College Pr, 2014. HRD. État : New. New Book. Shipped from US within 10 to 14 business days. Established seller since 2000. N° de réf. du libraire TL-9781908979629

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Rozaliya & Ice Barabash
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Description du livre Imperial College Press 2014-05-24, 2014. Hardcover. État : New. N° de réf. du libraire NU-MAR-00021700

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Barabash, Rozaliya (EDT)/ Ice, Gene (EDT)
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Rozaliya I. Barabash
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Description du livre Imperial College Press, 2014. HRD. État : New. New Book.Shipped from US within 10 to 14 business days.THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du libraire IP-9781908979629

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Rozaliya I. Barabash, Gene Ice
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Description du livre Imperial College Press. Hardback. État : new. BRAND NEW, Strain and Dislocation Gradients from Diffraction, Rozaliya I. Barabash, Gene Ice, This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating. N° de réf. du libraire B9781908979629

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Description du livre État : New. This item is Print on Demand - Depending on your location, this item may ship from the US or UK. N° de réf. du libraire POD_9781908979629

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