Articles liés à Advanced Computing in Electron Microscopy
Synopsis
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
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À propos de l?auteur
Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.
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- ÉditeurSpringer
- Date d'édition2021
- ISBN 10 3030332624
- ISBN 13 9783030332624
- ReliureBroché
- Langueanglais
- Numéro d'édition3
- Nombre de pages368
- Coordonnées du fabricantnon disponible
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Advanced Computing in Electron Microscopy
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Springer International Publishing, 2021
ISBN 10 : 3030332624
ISBN 13 : 9783030332624
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade. N° de réf. du vendeur 451426592
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Advanced Computing in Electron Microscopy
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Advanced Computing in Electron Microscopy
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Springer International Publishing, Springer Nature Switzerland, 2021
ISBN 10 : 3030332624
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. N° de réf. du vendeur 9783030332624
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Advanced Computing in Electron Microscopy
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch. N° de réf. du vendeur 9783030332624
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Advanced Computing in Electron Microscopy
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