Articles liés à Exploring Scanning Probe Microscopy With Mathematica
L'édition de cet ISBN n'est malheureusement plus disponible.
Afficher les exemplaires de cette édition ISBN
Exploring Scanning Probe Microscopy with Mathematica This new and updated edition features a new applications section, reflecting the many breakthroughs in the field over the last years. It provides a set of computational models that describe the physical phenomena associated with atomic force microscopy and related technologies. Full description
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Présentation de l'éditeur :
This new and completely updated edition features not only an accompanying CD–ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies.
The result is both a solid professional reference and an advanced–level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip–sample interactions, and cantilever vibration characteristics. This is followed by an in–depth treatment of theoretical and practical aspects of tunneling phenomena, including metal–insulator–metal tunneling and Fowler–Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy.
The self–contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD–ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
Biographie de l'auteur :
The result is both a solid professional reference and an advanced–level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip–sample interactions, and cantilever vibration characteristics. This is followed by an in–depth treatment of theoretical and practical aspects of tunneling phenomena, including metal–insulator–metal tunneling and Fowler–Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy.
The self–contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD–ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
Dror Sarid is Professor and Director of the Optical Data Storage Center at the Optical Sciences Center, the University of Arizona in Tucson. His interests have been in the fields of light scattering phenomena and guided wave physics, and in the past 20 years he has been studying Scanning Tunneling Microscopy, Atomic Force Microscopy and related fields. Dr. Sarid is the author of ′Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces′ (OUP) and ′Exploring Scanning Probe Microscopy with Mathematica′ (Wiley) as well as of more than 150 publications and seven patents.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurBlackwell Verlag GmbH
- Date d'édition2007
- ISBN 10 3527406174
- ISBN 13 9783527406173
- ReliureRelié
- Numéro d'édition2
- Nombre de pages310
Acheter neuf
En savoir plus sur cette édition
EUR 281,95
Frais de port :
EUR 4,69
Vers Etats-Unis
Meilleurs résultats de recherche sur AbeBooks
Image d'archives
EXPLORING SCANNING PROBE MICROSC
Edité par
Wiley-VCH
(2007)
ISBN 10 : 3527406174
ISBN 13 : 9783527406173
Neuf
Couverture rigide
Quantité disponible : 1
Vendeur :
Evaluation vendeur
Description du livre Etat : New. New. In shrink wrap. Looks like an interesting title! 1.2. N° de réf. du vendeur Q-3527406174
Acheter neuf
EUR 281,95
Autre devise