Designing a Robust Mesh of Clusters FPGA: Hardening basic blocks

 
9783659662836: Designing a Robust Mesh of Clusters FPGA: Hardening basic blocks
Présentation de l'éditeur :

This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted.

Biographie de l'auteur :

Arwa Ben Dhia is currently a researcher at Télécom ParisTech, Paris, France. She received the titles of Eng. and Dr. in 2011 and 2014, respectively from Télécom ParisTech.Lirida Naviner is a full professor in the same institution, and head of the research team working on reliability in digital circuits.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Acheter neuf Afficher le livre
EUR 42,24

Autre devise

Frais de port : EUR 10,40
De Royaume-Uni vers Etats-Unis

Destinations, frais et délais

Ajouter au panier

Meilleurs résultats de recherche sur AbeBooks

1.

Ben Dhia Arwa
Edité par LAP Lambert Academic Publishing (2015)
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Quantité : > 20
impression à la demande
Vendeur
Books2Anywhere
(Fairford, GLOS, Royaume-Uni)
Evaluation vendeur
[?]

Description du livre LAP Lambert Academic Publishing, 2015. PAP. État : New. New Book. Delivered from our UK warehouse in 3 to 5 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du libraire LQ-9783659662836

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 42,24
Autre devise

Ajouter au panier

Frais de port : EUR 10,40
De Royaume-Uni vers Etats-Unis
Destinations, frais et délais

2.

Ben Dhia Arwa
Edité par LAP Lambert Academic Publishing (2016)
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Paperback Quantité : 1
impression à la demande
Vendeur
Ria Christie Collections
(Uxbridge, Royaume-Uni)
Evaluation vendeur
[?]

Description du livre LAP Lambert Academic Publishing, 2016. Paperback. État : New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. N° de réf. du libraire ria9783659662836_lsuk

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 49,34
Autre devise

Ajouter au panier

Frais de port : EUR 3,86
De Royaume-Uni vers Etats-Unis
Destinations, frais et délais

3.

Ben Dhia Arwa; Naviner Lirida
Edité par LAP Lambert Academic Publishing (2015)
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Couverture souple Quantité : 15
impression à la demande
Vendeur
English-Book-Service Mannheim
(Mannheim, Allemagne)
Evaluation vendeur
[?]

Description du livre LAP Lambert Academic Publishing, 2015. État : New. This item is printed on demand for shipment within 3 working days. N° de réf. du libraire LP9783659662836

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 49,90
Autre devise

Ajouter au panier

Frais de port : EUR 5
De Allemagne vers Etats-Unis
Destinations, frais et délais

4.

Ben Dhia Arwa
Edité par LAP Lambert Academic Publishing (2015)
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Quantité : > 20
impression à la demande
Vendeur
PBShop
(Wood Dale, IL, Etats-Unis)
Evaluation vendeur
[?]

Description du livre LAP Lambert Academic Publishing, 2015. PAP. État : New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du libraire IQ-9783659662836

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 54,94
Autre devise

Ajouter au panier

Frais de port : EUR 3,70
Vers Etats-Unis
Destinations, frais et délais

5.

Arwa Ben Dhia
Edité par LAP LAMBERT Academic Publishing
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Paperback Quantité : 20
Vendeur
BuySomeBooks
(Las Vegas, NV, Etats-Unis)
Evaluation vendeur
[?]

Description du livre LAP LAMBERT Academic Publishing. Paperback. État : New. Paperback. 116 pages. Dimensions: 8.7in. x 5.9in. x 0.3in.This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. N° de réf. du libraire 9783659662836

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 62,29
Autre devise

Ajouter au panier

Frais de port : EUR 3,66
Vers Etats-Unis
Destinations, frais et délais

6.

Ben Dhia Arwa, Naviner Lirida
Edité par LAP Lambert Academic Publishing, United States (2015)
ISBN 10 : 3659662836 ISBN 13 : 9783659662836
Neuf(s) Paperback Quantité : > 20
impression à la demande
Vendeur
The Book Depository EURO
(London, Royaume-Uni)
Evaluation vendeur
[?]

Description du livre LAP Lambert Academic Publishing, United States, 2015. Paperback. État : New. 220 x 150 mm. Language: English . Brand New Book ***** Print on Demand *****.This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted. N° de réf. du libraire AAV9783659662836

Plus d'informations sur ce vendeur | Poser une question au libraire

Acheter neuf
EUR 68,41
Autre devise

Ajouter au panier

Frais de port : EUR 3,47
De Royaume-Uni vers Etats-Unis
Destinations, frais et délais