Designing a Robust Mesh of Clusters FPGA: Hardening basic blocks

 
9783659662836: Designing a Robust Mesh of Clusters FPGA: Hardening basic blocks

This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

About the Author :

Arwa Ben Dhia is currently a researcher at Télécom ParisTech, Paris, France. She received the titles of Eng. and Dr. in 2011 and 2014, respectively from Télécom ParisTech.Lirida Naviner is a full professor in the same institution, and head of the research team working on reliability in digital circuits.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

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Description du livre LAP Lambert Academic Publishing, 2015. PAP. État : New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du libraire IQ-9783659662836

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Description du livre LAP LAMBERT Academic Publishing. Paperback. État : New. Paperback. 116 pages. Dimensions: 8.7in. x 5.9in. x 0.3in.This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. N° de réf. du libraire 9783659662836

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Description du livre LAP Lambert Academic Publishing, United States, 2015. Paperback. État : New. Language: English . Brand New Book ***** Print on Demand *****.This book deals with fault tolerance in Field Programmable Gate Arrays (FPGAs). Reliability core concepts are first presented. The types of faults and their masking phenomena are then explained. The most common fault tolerance analysis methods are detailed, as well as hardening techniques aimed at enhancing reliability. An introduction to FPGAs is also given. Then, for reasons that are explained, the focus is on the Mesh of Clusters FPGA architecture whose basic blocks (logic and interconnect) are hardened in different ways and at different granularity levels (from RTL to transistor level). Tradeoff between reliability improvement and consequent penalties is highlighted. N° de réf. du libraire AAV9783659662836

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