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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment - Couverture souple
Synopsis
Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.
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Radiation Harden devices and Circuits for Analog Application
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Chandra PrakashChandra Prakash Jain Obtained B.E, M.Tech and pursuing PhD in VLSI Design. He worked in Instrumentation Limited, Kota for 2 years. Presently he is Sr. Assistant Professor in Electronics department at Banasthali Un. N° de réf. du vendeur 5482223
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Couverture souple
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9783845432021_new
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Radiation Harden devices and Circuits for Analog Application Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
PAP
Vendeur : PBShop.store US, Wood Dale, IL, Etats-Unis
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PAP. Etat : New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du vendeur L0-9783845432021
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Radiation Harden devices and Circuits for Analog Application Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
PAP
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PAP. Etat : New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du vendeur L0-9783845432021
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Couverture souple
Vendeur : California Books, Miami, FL, Etats-Unis
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Etat : New. N° de réf. du vendeur I-9783845432021
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Radiation Harden devices and Circuits for Analog Application : Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library. N° de réf. du vendeur 9783845432021
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Radiation Harden devices and Circuits for Analog Application
Edité par
LAP LAMBERT Academic Publishing Sep 2011, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library. 96 pp. Englisch. N° de réf. du vendeur 9783845432021
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Radiation Harden devices and Circuits for Analog Application
Edité par
LAP LAMBERT Academic Publishing Sep 2011, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.Books on Demand GmbH, Überseering 33, 22297 Hamburg 96 pp. Englisch. N° de réf. du vendeur 9783845432021
Quantité disponible : 2 disponible(s)
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Neuf
Couverture souple
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
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Etat : New. N° de réf. du vendeur ABLING22Oct2817100619798
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
Edité par
LAP LAMBERT Academic Publishing, 2011
ISBN 10 : 3845432020
ISBN 13 : 9783845432021
Ancien ou d'occasion
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Paperback. Etat : Like New. Like New. book. N° de réf. du vendeur ERICA75838454320206
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