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Synopsis
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
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Présentation de l'éditeur
This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields.
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- ÉditeurSpringer
- Date d'édition2012
- ISBN 10 9400736878
- ISBN 13 9789400736870
- ReliureBroché
- Langueanglais
- Nombre de pages212
- Coordonnées du fabricantnon disponible
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Edité par
Springer Netherlands, 2012
ISBN 10 : 9400736878
ISBN 13 : 9789400736870
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial. N° de réf. du vendeur 5826709
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Edité par
Springer Netherlands Mrz 2012, 2012
ISBN 10 : 9400736878
ISBN 13 : 9789400736870
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. 212 pp. Englisch. N° de réf. du vendeur 9789400736870
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Edité par
Springer Netherlands, Springer Netherlands, 2012
ISBN 10 : 9400736878
ISBN 13 : 9789400736870
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. N° de réf. du vendeur 9789400736870
Quantité disponible : 1 disponible(s)
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Edité par
Springer Netherlands, Springer Netherlands Mär 2012, 2012
ISBN 10 : 9400736878
ISBN 13 : 9789400736870
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 212 pp. Englisch. N° de réf. du vendeur 9789400736870
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
impression à la demandeVendeur : Majestic Books, Hounslow, Royaume-Uni
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Etat : New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam. N° de réf. du vendeur 11254900
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
impression à la demandeVendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Etat : New. PRINT ON DEMAND pp. 212. N° de réf. du vendeur 1814418849
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Paperback. Etat : Brand New. 2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock. N° de réf. du vendeur x-9400736878
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
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Etat : New. N° de réf. du vendeur ABLIING23Apr0412070050440
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9789400736870_new
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