New Insulators Devices and Radiation Effects: Volume 3 (Hardback)

Edité par ELSEVIER SCIENCE TECHNOLOGY, 1999
ISBN 10: 0444818014 / ISBN 13: 9780444818010
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Language: English . Brand New Book. Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. However, silicon devices are still subject to undesired electrical phenomena called instabilities . These are due mostly to the imperfect nature of the insulators used, to the not-so-perfect silicon-insulator interface and to the generation of defects and ionization phenomena caused by radiation.The problem of instabilities is addressed in this volume, the third of this book series.Vol.3 updates and supplements the material presented in the previous two volumes, and devotes five chapters to the problems of radiation-matter and radiation-device interactions. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the presence of physical defects and impurities or to the radiation environment which caused them. N° de réf. du libraire

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Présentation de l'éditeur: Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. However, silicon devices are still subject to undesired electrical phenomena called "instabilities". These are due mostly to the imperfect nature of the insulators used, to the not-so-perfect silicon-insulator interface and to the generation of defects and ionization phenomena caused by radiation.

The problem of instabilities is addressed in this volume, the third of this book series.

Vol.3 updates and supplements the material presented in the previous two volumes, and devotes five chapters to the problems of radiation-matter and radiation-device interactions. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the presence of physical defects and impurities or to the radiation environment which caused them.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

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Titre : New Insulators Devices and Radiation Effects...
Éditeur : ELSEVIER SCIENCE TECHNOLOGY
Date d'édition : 1999
Reliure : Hardback
Etat du livre : New

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Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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HPB-Dallas
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Description du livre North Holland, 1999. Hardcover. Etat : Acceptable. Volume 3 only; Ex-library book Item is intact, but may show shelf wear. Pages may include notes and highlighting. May or may not include supplemental or companion material. Access codes may or may not work. Connecting readers since 1972. Customer service is our top priority. N° de réf. du vendeur mon0001144035

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BARBOTTIN , GERARD; VAPAILLE, ANDRE
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ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre North Holland, 1999. Hardback. Etat : NEW. 9780444818010 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. N° de réf. du vendeur HTANDREE01203225

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MEURANT, GERARD
Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Herb Tandree Philosophy Books
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Description du livre North Holland, 1999. Hardback. Etat : NEW. 9780444818010 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. N° de réf. du vendeur HTANDREE0897738

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Edité par ELSEVIER SCIENCE TECHNOLOGY, United States (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre ELSEVIER SCIENCE TECHNOLOGY, United States, 1999. Hardback. Etat : New. Language: English . Brand New Book. Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. However, silicon devices are still subject to undesired electrical phenomena called instabilities . These are due mostly to the imperfect nature of the insulators used, to the not-so-perfect silicon-insulator interface and to the generation of defects and ionization phenomena caused by radiation.The problem of instabilities is addressed in this volume, the third of this book series.Vol.3 updates and supplements the material presented in the previous two volumes, and devotes five chapters to the problems of radiation-matter and radiation-device interactions. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the presence of physical defects and impurities or to the radiation environment which caused them. N° de réf. du vendeur AA59780444818010

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Edité par ELSEVIER SCIENCE TECHNOLOGY, United States (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Book Depository International
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Description du livre ELSEVIER SCIENCE TECHNOLOGY, United States, 1999. Hardback. Etat : New. Language: English . Brand New Book. Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the physical properties of silicon but also in the unique properties of the silicon-silicon dioxide interface. However, silicon devices are still subject to undesired electrical phenomena called instabilities . These are due mostly to the imperfect nature of the insulators used, to the not-so-perfect silicon-insulator interface and to the generation of defects and ionization phenomena caused by radiation.The problem of instabilities is addressed in this volume, the third of this book series.Vol.3 updates and supplements the material presented in the previous two volumes, and devotes five chapters to the problems of radiation-matter and radiation-device interactions. The volume will aid circuit manufacturers and circuit users alike to relate unstable electrical parameters and characteristics to the presence of physical defects and impurities or to the radiation environment which caused them. N° de réf. du vendeur AA59780444818010

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UNKNOWN AUTHOR
Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre North Holland, 1999. Hardcover. Etat : New. 1. N° de réf. du vendeur DADAX0444818014

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Author Unknown
Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre North Holland, 1999. Hardcover. Etat : Used: Good. N° de réf. du vendeur SONG0444818014

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Barbottin, Gerard (Editor)/ Vapaille, Andre (Editor)
Edité par North-Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre North-Holland, 1999. Hardcover. Etat : Brand New. 1st edition. 964 pages. 10.25x7.75x1.75 inches. In Stock. N° de réf. du vendeur zk0444818014

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Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Irish Booksellers
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Description du livre North Holland, 1999. Hardcover. Etat : New. book. N° de réf. du vendeur M0444818014

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North Holland
Edité par North Holland (1999)
ISBN 10 : 0444818014 ISBN 13 : 9780444818010
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Description du livre North Holland, 1999. Hardcover. Etat : Good. 1. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!. N° de réf. du vendeur 0444818014

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