Nonvolatile Memory Technologies with Emphasis on Flash (Hardcover)

Joe Brewer

ISBN 10: 0471770027 / ISBN 13: 9780471770022

Edité par John Wiley & Sons Inc, Chicester, 2008

A propos de cet article

Hardcover. Presented here is an all-inclusive treatment of Flash technology, including Flash memory chips, Flash embedded in logic, binary cell Flash, and multilevel cell Flash. The book begins with a tutorial of elementary concepts to orient readers who are less familiar with the subject. Next, it covers all aspects and variations of Flash technology at a mature engineering level: basic device structures, principles of operation, related process technologies, circuit design, overall design tradeoffs, device testing, reliability, and applications. Nonvolatile Memory Technologies with Emphasis on Flash (NMT) provides a detailed view of the integrated circuit main line technologies; the book gives an introduction to technologies that have less manufacturing exposure, and presents a description of various possible alternative technologies that may emerge in the future. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

N° de réf. du vendeur 9780471770022

Détails bibliographiques

• Titre: Nonvolatile Memory Technologies with Emphasis on Flash (Hardcover)
• Éditeur: John Wiley & Sons Inc, Chicester
• Date de parution: 2008
• Langue: anglais
• ISBN à 10 chiffres: 0471770027
• ISBN à 13 chiffres: 9780471770022
• Reliure: Hardcover
• Édition: Edition originale
• État de l'article: new

A propos de ce titre

Synopsis

Presented here is an all-inclusive treatment of Flash technology, including Flash memory chips, Flash embedded in logic, binary cell Flash, and multilevel cell Flash. The book begins with a tutorial of elementary concepts to orient readers who are less familiar with the subject. Next, it covers all aspects and variations of Flash technology at a mature engineering level: basic device structures, principles of operation, related process technologies, circuit design, overall design tradeoffs, device testing, reliability, and applications.

À propos de l?auteur

Joe E. Brewer, MS, spent most of his career with Westinghouse Electric (now Northrop Grumman Corporation), where he retired in 1998. In 2000, he joined the faculty of the Electrical and Computer Engineering Department of the University of Florida. He was an early contributor to the IEEE Standards for MNOS Arrays and Floating Gate Arrays. He is a Fellow of the IEEE, has authored more than 100 papers, and holds seven U.S. patents.

Manzur Gill, PhD, is Chief Advancement Officer and Professor of Physics at Forman Christian College, Lahore, in Pakistan. Dr. Gill has more than twenty-five years of experience in high-tech industry and nonvolatile memory development, has authored over thirty technical publications in international journals, and holds over seventy-five patents.