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Ajouter au panierhardcover. Etat : Gut. 887 Seiten; 9783540286035.3 Gewicht in Gramm: 3.
Edité par Springer Berlin Heidelberg, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : Buchpark, Trebbin, Allemagne
EUR 484,74
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Ajouter au panierEtat : Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 748,99
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Ajouter au panierBuch. Etat : Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 748,99
Autre deviseQuantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.
Edité par Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : AussieBookSeller, Truganina, VIC, Australie
EUR 1 182,79
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Ajouter au panierHardcover. Etat : new. Hardcover. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. X-Ray Fluorescence analysis (XRF) is a multi-elemental and nondestructive analytical method used in research and industrial applications. This book provides self-contained modules featuring XRF instrumentation, quantification methods, and other applications. It gives a survey of the theoretical fundamentals, analytical instrumentation, and more. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Edité par Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : AussieBookSeller, Truganina, VIC, Australie
EUR 1 189,55
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : new. Paperback. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Edité par Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis
EUR 693,13
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : new. Hardcover. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. X-Ray Fluorescence analysis (XRF) is a multi-elemental and nondestructive analytical method used in research and industrial applications. This book provides self-contained modules featuring XRF instrumentation, quantification methods, and other applications. It gives a survey of the theoretical fundamentals, analytical instrumentation, and more. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 656,49
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Ajouter au panierEtat : New. In.
Edité par Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis
EUR 709,48
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : new. Paperback. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 1 034,31
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Ajouter au panierHardcover. Etat : Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.
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Ajouter au panierEtat : New.
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Ajouter au panierEtat : New.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 748,99
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 748,99
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.
EUR 1 032,70
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Ajouter au panierPaperback. Etat : Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 748,99
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Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. 904 pp. Englisch.
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 748,99
Autre deviseQuantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. 904 pp. Englisch.
Edité par Springer Berlin Heidelberg, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Langue: anglais
Vendeur : moluna, Greven, Allemagne
EUR 619,04
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest core reference in this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.
Edité par Springer Berlin Heidelberg, 2006
ISBN 10 : 3540286039 ISBN 13 : 9783540286035
Langue: anglais
Vendeur : moluna, Greven, Allemagne
EUR 619,04
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest core reference in this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.