rosenauer andreas (10 résultats)

Hardcover. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-00136 9783540004141 Sprache: Englisch Gewicht in Gramm: 550.

Etat : New.

Etat : New. In.

Paperback. Etat : New.

Paperback. Etat : Brand New. reprint edition. 253 pages. 9.26x6.11x0.70 inches. In Stock.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductornanostructures with a spatial resolution at near atomic scales. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.The basics of these procedures as well as theiradvantages, drawbacks and sources of error are alldiscussed. The techniques are applied to quantumwells and dots in order to give insight intokinetic growth effects such as segregation andmigration. In the first part of the book the fundamentals oftransmission electron microscopy are provided.These are needed for an understanding of thedigital image analysis techniques described in thesecond part of the book. There the reader willfind information on different methods ofcomposition determination. The third part of thebook focuses on applications such as compositiondetermination in InGaAs Stranski--Krastanovquantum dots. Finally it is shown how animprovement in the precision of the compositionevaluation can be obtained by combining CELFA withelectron holography. This is demonstrated for anAlAs/GaAs superlattice.

Taschenbuch. Etat : Neu. Transmission Electron Microscopy of Semiconductor Nanostructures | An Analysis of Composition and Strain State | Andreas Rosenauer | Taschenbuch | xii | Englisch | 2013 | Springer-Verlag GmbH | EAN 9783662146187 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductornanostructures with a spatial resolution at near atomic scales. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.The basics of these procedures as well as theiradvantages, drawbacks and sources of error are alldiscussed. The techniques are applied to quantumwells and dots in order to give insight intokinetic growth effects such as segregation andmigration. In the first part of the book the fundamentals oftransmission electron microscopy are provided.These are needed for an understanding of thedigital image analysis techniques described in thesecond part of the book. There the reader willfind information on different methods ofcomposition determination. The third part of thebook focuses on applications such as compositiondetermination in InGaAs Stranski--Krastanovquantum dots. Finally it is shown how animprovement in the precision of the compositionevaluation can be obtained by combining CELFA withelectron holography. This is demonstrated for anAlAs/GaAs superlattice. 256 pp. Englisch.

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Up-to-date overviewNo related/competitive literature on the marketCovers fundamentals and current topics of TEMHighly important technology for future production of nanostructuresThis book provides tools well suited for thequa.

Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductornanostructures with a spatial resolution at near atomic scales. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.The basics of these procedures as well as theiradvantages, drawbacks and sources of error are alldiscussed. The techniques are applied to quantumwells and dots in order to give insight intokinetic growth effects such as segregation andmigration. In the first part of the book the fundamentals oftransmission electron microscopy are provided.These are needed for an understanding of thedigital image analysis techniques described in thesecond part of the book. There the reader willfind information on different methods ofcomposition determination. The third part of thebook focuses on applications such as compositiondetermination in InGaAs Stranski--Krastanovquantum dots. Finally it is shown how animprovement in the precision of the compositionevaluation can be obtained by combining CELFA withelectron holography. This is demonstrated for anAlAs/GaAs superlattice.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 256 pp. Englisch.