Edité par Springer, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : booksXpress, Bayonne, NJ, Etats-Unis
Hardcover. Etat : new.
Edité par Springer, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Etat : New.
Edité par Springer, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Edité par Springer US, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : moluna, Greven, Allemagne
Gebunden. Etat : New. Part One. Open issues in conformance test specification. OSI protocol testing system based on user friendly test scenario specification functions. TTCN test case correctness validation. Invited Address 1. Fault coverage of tests based on finite state .
Edité par Springer, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Hardcover. Etat : Like New. Like New. book.
Edité par Springer Nature Singapore Jun 1995, 1995
ISBN 10 : 0412711605 ISBN 13 : 9780412711602
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Buch. Etat : Neu. Neuware - This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.