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Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : booksXpress, Bayonne, NJ, Etats-Unis
Livre
Hardcover. Etat : new.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Livre impression à la demande
Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : GF Books, Inc., Hawthorne, CA, Etats-Unis
Livre
Etat : Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Books Unplugged, Amherst, NY, Etats-Unis
Livre
Etat : New. Buy with confidence! Book is in new, never-used condition.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Livre
Etat : New.
Edité par Springer New York, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : moluna, Greven, Allemagne
Livre impression à la demande
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive guide to designing the most effective and lowest-cost microelectronic test structuresUses specific examples of good design techniques and discusses common errors to avoid in order to guide readersPresents an integrat.
Edité par Springer New York Aug 2011, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Livre impression à la demande
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology. 408 pp. Englisch.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Books Unplugged, Amherst, NY, Etats-Unis
Livre
Etat : Fair. Buy with confidence! Book is in acceptable condition with wear to the pages, binding, and some marks within.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : GF Books, Inc., Hawthorne, CA, Etats-Unis
Livre
Etat : Good. Book is in Used-Good condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain limited notes and highlighting.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Book Deals, Tucson, AZ, Etats-Unis
Livre
Etat : New. New! This book is in the same immaculate condition as when it was published.
Edité par Springer New York, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Livre
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
Edité par Springer, 2011
ISBN 10 : 1441993762ISBN 13 : 9781441993762
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Livre
Hardcover. Etat : Like New. Like New. book.