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Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Phatpocket Limited, Waltham Abbey, HERTS, Royaume-Uni
Livre
Etat : Like New. Used - Like New. Book is new and unread but may have minor shelf wear. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : ThriftBooks-Dallas, Dallas, TX, Etats-Unis
Livre
Hardcover. Etat : As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less 0.8.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Ergodebooks, Houston, TX, Etats-Unis
Livre
Hardcover. Etat : Good. 2012. Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate interface phenomena and the principles that govern them. Metal-Dielectric Interfaces in Gigascale Electronics provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design.
Edité par Springer New York, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Buchpark, Trebbin, Allemagne
Livre
Etat : Sehr gut. Zustand: Sehr gut - Neubindung, Buchschnitt leicht verkürzt, Buchecken und -rücken leicht angestoßen, Ausgabe 2012 | Seiten: 164 | Sprache: Englisch | Produktart: Bücher.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : booksXpress, Bayonne, NJ, Etats-Unis
Livre
Hardcover. Etat : new.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Livre
Etat : New.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Livre
Etat : New.
Edité par Springer New York Dez 2011, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Livre impression à la demande
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate interface phenomena and the principles that govern them. Metal-Dielectric Interfaces in Gigascale Electronics provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design. 164 pp. Englisch.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Books Puddle, New York, NY, Etats-Unis
Livre
Etat : New. pp. 164.
Edité par Springer New York, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : moluna, Greven, Allemagne
Livre
Gebunden. Etat : New.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : GreatBookPricesUK, Castle Donington, DERBY, Royaume-Uni
Livre
Etat : New.
Edité par Springer New York, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Livre
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate interface phenomena and the principles that govern them. Metal-Dielectric Interfaces in Gigascale Electronics provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design.
Edité par Springer Verlag, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Livre
Hardcover. Etat : Brand New. 2012 edition. 160 pages. 6.25x9.25x0.50 inches. In Stock.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Livre impression à la demande
Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Majestic Books, Hounslow, Royaume-Uni
Livre impression à la demande
Etat : New. Print on Demand pp. 164 120 Illus. (48 Col.).
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : GreatBookPricesUK, Castle Donington, DERBY, Royaume-Uni
Livre
Etat : As New. Unread book in perfect condition.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Livre
Hardcover. Etat : Like New. Like New. book.
Edité par Springer, 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Livre
Etat : As New. Unread book in perfect condition.
Edité par Springer-Verlag New York Inc., 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Kennys Bookstore, Olney, MD, Etats-Unis
Livre
Etat : New. This book presents a unified approach to understanding the diverse phenomena observed at metal-dielectric interfaces. It offers a clear account of the relationship between interface science and its applications in interconnect structures. Series: Springer Series in Materials Science. Num Pages: 160 pages, biography. BIC Classification: PNRH; TDPB; TGMB; TJFD. Category: (P) Professional & Vocational. Dimension: 243 x 169 x 14. Weight in Grams: 386. . 2011. 2012th Edition. Hardcover. . . . . Books ship from the US and Ireland.
Edité par Springer-Verlag New York Inc., 2011
ISBN 10 : 1461418119ISBN 13 : 9781461418115
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
Livre
Etat : New. This book presents a unified approach to understanding the diverse phenomena observed at metal-dielectric interfaces. It offers a clear account of the relationship between interface science and its applications in interconnect structures. Series: Springer Series in Materials Science. Num Pages: 160 pages, biography. BIC Classification: PNRH; TDPB; TGMB; TJFD. Category: (P) Professional & Vocational. Dimension: 243 x 169 x 14. Weight in Grams: 386. . 2011. 2012th Edition. Hardcover. . . . .