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Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : booksXpress, Bayonne, NJ, Etats-Unis
Livre
Soft Cover. Etat : new.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Livre impression à la demande
Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Livre
Etat : New.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : GF Books, Inc., Hawthorne, CA, Etats-Unis
Livre
Etat : New. Book is in NEW condition. 2.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Book Deals, Tucson, AZ, Etats-Unis
Livre
Etat : New. New! This book is in the same immaculate condition as when it was published 2.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : GreatBookPricesUK, Castle Donington, DERBY, Royaume-Uni
Livre
Etat : New.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Livre
Etat : New.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Livre
Etat : As New. Unread book in perfect condition.
Edité par Springer US, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : moluna, Greven, Allemagne
Livre impression à la demande
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated.
Edité par Springer US Jun 2013, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Livre impression à la demande
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age. 480 pp. Englisch.
Edité par Springer US, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Livre
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : GreatBookPricesUK, Castle Donington, DERBY, Royaume-Uni
Livre
Etat : As New. Unread book in perfect condition.
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : California Books, Miami, FL, Etats-Unis
Livre
Etat : New.
Edité par Springer-Verlag New York Inc., 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
Livre
Etat : New. Editor(s): Thong, John T. L. Series: Microdevices. Num Pages: 478 pages, biography. BIC Classification: PHF; PHFC; PNFS; THR; TJFD. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 24. Weight in Grams: 826. . 2013. Softcover reprint of the original 1st ed. 1993. Paperback. . . . .
Edité par Springer, 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Livre
Paperback. Etat : Brand New. reprint edition. 478 pages. 10.01x7.01x1.09 inches. In Stock.
Edité par Springer-Verlag New York Inc., 2013
ISBN 10 : 1489915249ISBN 13 : 9781489915245
Vendeur : Kennys Bookstore, Olney, MD, Etats-Unis
Livre
Etat : New. Editor(s): Thong, John T. L. Series: Microdevices. Num Pages: 478 pages, biography. BIC Classification: PHF; PHFC; PNFS; THR; TJFD. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 24. Weight in Grams: 826. . 2013. Softcover reprint of the original 1st ed. 1993. Paperback. . . . . Books ship from the US and Ireland.