9789400957572 - The Statistical Analysis of Spatial Pattern de Bartlett, M. S. S. (10 résultats)

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Etat : New. pp. 106.

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.

Taschenbuch. Etat : Neu. The Statistical Analysis of Spatial Pattern | M. S. Bartlett | Taschenbuch | x | Englisch | 2013 | Springer Netherland | EAN 9789400957572 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Etat : New. Print on Demand pp. 106 22:B&W 5.5 x 8.5 in or 216 x 140 mm (Demy 8vo) Perfect Bound on White w/Gloss Lam.

Etat : New. PRINT ON DEMAND pp. 106.

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribu.

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes. 104 pp. Englisch.

Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 104 pp. Englisch.