L'édition de cet ISBN n'est malheureusement plus disponible.
Afficher les exemplaires de cette édition ISBNLes informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Frais de port :
EUR 2,46
Vers Etats-Unis
Description du livre Etat : New. N° de réf. du vendeur 5844275-n
Description du livre Hardcover. Etat : new. N° de réf. du vendeur 9780387857305
Description du livre Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. N° de réf. du vendeur ria9780387857305_lsuk
Description du livre Etat : new. N° de réf. du vendeur FrontCover0387857303
Description du livre Hardcover. Etat : new. New. Fast Shipping and good customer service. N° de réf. du vendeur Holz_New_0387857303
Description du livre Etat : New. N° de réf. du vendeur 5844275-n
Description du livre Etat : New. N° de réf. du vendeur ABLIING23Feb2215580173441
Description du livre Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. 344 pp. Englisch. N° de réf. du vendeur 9780387857305
Description du livre Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Identifies problems that all specimens present in examining their structure and analysis in the SEMDescribes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identifiedGuides the reader t. N° de réf. du vendeur 5911397
Description du livre Hardback. Etat : New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. N° de réf. du vendeur C9780387857305