Articles liés à Electron Beam Testing Technology
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Présentation de l'éditeur :
This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.
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- ÉditeurSpringer
- Date d'édition2013
- ISBN 10 1489915249
- ISBN 13 9781489915245
- ReliureBroché
- Nombre de pages480
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Electron Beam Testing Technology (Microdevices) [Paperback ]
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ISBN 10 : 1489915249
ISBN 13 : 9781489915245
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Description du livre Soft Cover. Etat : new. N° de réf. du vendeur 9781489915245
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Electron Beam Testing Technology
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Description du livre Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. N° de réf. du vendeur ria9781489915245_lsuk
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Electron Beam Testing Technology (Microdevices)
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Description du livre Etat : New. Book is in NEW condition. 2. N° de réf. du vendeur 1489915249-2-1
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Electron Beam Testing Technology (Microdevices)
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ISBN 10 : 1489915249
ISBN 13 : 9781489915245
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Description du livre Etat : New. New! This book is in the same immaculate condition as when it was published 2. N° de réf. du vendeur 353-1489915249-new
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Electron Beam Testing Technology (Microdevices)
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Description du livre Etat : New. N° de réf. du vendeur ABLIING23Mar2716030157425
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Electron Beam Testing Technology
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Description du livre Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated. N° de réf. du vendeur 4211711
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Electron Beam Testing Technology
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Description du livre Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age. 480 pp. Englisch. N° de réf. du vendeur 9781489915245
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Electron Beam Testing Technology
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ISBN 10 : 1489915249
ISBN 13 : 9781489915245
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Description du livre Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age. N° de réf. du vendeur 9781489915245
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Electron Beam Testing Technology (Microdevices)
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ISBN 10 : 1489915249
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Description du livre Etat : New. N° de réf. du vendeur I-9781489915245
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Electron Beam Testing Technology (Microdevices)
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ISBN 10 : 1489915249
ISBN 13 : 9781489915245
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Paperback
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Description du livre Paperback. Etat : Brand New. reprint edition. 478 pages. 10.01x7.01x1.09 inches. In Stock. N° de réf. du vendeur x-1489915249
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