Power Integrity: Measuring, Optimizing and Troubleshooting Power Related Parameters in Electronic Systems - Couverture rigide

Sandler, Steven

Couverture rigide

ISBN 10 : 0071830995 ISBN 13 : 9780071830997

Editeur : McGraw-Hill Professional, 2014

Synopsis

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PROVEN TECHNIQUES FOR GENERATING HIGH-FIDELITY MEASUREMENTS

Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide.

Learn how to accurately measure:

• Impedance
• Stability
• Power supply rejection ratio (PSRR)
• Reverse transfer and crosstalk
• Step load response
• Ripple and noise
• Edges
• High-frequency impedance

A propos du livre

À propos de l?auteur

Steven M. Sandler (Mesa, AZ) is currently a consultant to AEi Systems LLC, a power electronics firm he founded in 1995. He has developed and taught courses at Motorola University and has published many articles on power circuit modeling for PCIM, PEIN, and Intusoft Online. He holds a BSEE from Pacific Western University, and is the author of Spice3 SMPS Simulation.

Détails de l'édition

• Éditeur: McGraw-Hill Professional
• Date d'édition: 2014
• Langue: anglais
• ISBN 10: 0071830995
• ISBN 13: 9780071830997
• Reliure: Relié
• Nombre de pages: 352
• Coordonnées du fabricant: non disponible