Vendeur : Peter White Books, Alton, Royaume-Uni
Hard Cover. Vg (no dj, clean black cloth with gilt titles on green panel on spine, Royal Aircraft Establishment library markings else contents no fault) octavo 259pp. Electron micrograph analysis by optical transforms; Recent advances in electron beam addressed memories; Electron beams as analytical tools in surface research - LEED and AES; X-ray image intensifiers. N° de réf. du vendeur 5850
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