Articles liés à Speckle Metrology
Speckle Metrology - Couverture rigide
Livre 5 sur 10: Quantum Electronics-Principles and Applications
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SPECKLE METROLOGY (QUANTUM ELECTRONICS - PRINCIPLES AND APPLICATIONS)
Edité par
Academic Press, NEW YORK, 1978
ISBN 10 : 0122413601
ISBN 13 : 9780122413605
Ancien ou d'occasion
Couverture rigide
Vendeur : The Sensible Magpie, Creswell, OR, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
Hardcover. Designed as a self-contained reference work, the book sets down basic concepts and properties to develop theory and techniques for solving practical measurement problems in industry, "including such areas as surface roughness evaluation, displacement and strain movement, and vibration and deformation analysis." 331 pp. Some light soiling to board surfaces, previous owner's name blacked out to top and bottom edges and FFEP, DJ has very tiniest bit of edgewear and some light creasing to front flap and very light soiling to panel surfaces. Book has gilt lettering to front board and spine, is tight, bright, and clean. Very Good Plus / Very Good Plus. N° de réf. du vendeur 225
Acheter D'occasion
EUR 15,91
Expédition à EUR 5,11
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)
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Speckle Metrology / Quantum Electronics Principles and Applications
Edité par
Academic Press, Inc., a subsidiary of Harcourt, Btace, Jovanovich, Publishers, New York - San Francisco - London, 1978
ISBN 10 : 0122413601
ISBN 13 : 9780122413605
Ancien ou d'occasion
Couverture rigide
Edition originale
Vendeur : Cat's Curiosities, Pahrump, NV, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
Hardcover. Etat : As New. Etat de la jaquette : Near Fine. Jacket design by Billm Haislip (illustrateur). 1st Edition. One of a series of monographs edited by Yoh-Han Pao and Paul Kelley. Numerous contributors including A. Luxmoore of the University College of Swansea and A. Tiziani of Wild Heerbrugg Ltd., Heerbrugg, Switzerland. Mr. Erf was of the United Technologies Research Center, East Hartford, Conn. Surface Roughness Measurement; Displacement and Strain Measurement; Vibration Analysis and Deformation Measurement; Electronic Speckle Pattern Interferometry; Topological Speckle and Structures Inspection; Measurement of Crystal Length Changes; Measurement of Displacement Around Crack Tips, etc. On a nice coated stock, well illustrated with diagrams and B&W plates. 331 pp. including index. Reduced from $45. N° de réf. du vendeur 003010
Acheter D'occasion
EUR 16,79
Expédition à EUR 5,15
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)