Articles liés à VLSI Test Principles And Architectures: Design for...

VLSI Test Principles And Architectures: Design for Testability - Couverture rigide

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

 
9780123705976: VLSI Test Principles And Architectures: Design for Testability
Couverture rigide
ISBN 10 : 0123705975 ISBN 13 : 9780123705976
Editeur : Morgan Kaufmann Publishers In, 2006

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos des auteurs

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Morgan Kaufmann Publishers In
Date d'édition
2006
Langue
anglais
ISBN 10 
0123705975
ISBN 13 
9780123705976
Reliure
Relié
Nombre de pages
808
Coordonnées du fabricant
non disponible
Personne responsable
non disponible