Radiometric Temperature Measurements: Fundamentals - Couverture rigide

Couverture rigide

ISBN 10 : 0123740215 ISBN 13 : 9780123740212

Editeur : Academic Press Inc, 2009

Synopsis

This book describes the theory, and practice of radiation thermometry, both at a primary level and for a variety of applications, such as in the materials processing industries and remote sensing. This book is written for those who will a) apply radiation thermometry in industrial practice b) use radiation thermometers for scientific research, c) the radiation thermometry specialist in a national measurement institute d) developers of radiation thermometers who are working to innovate products for instrument manufacturers and e) developers non-contact thermometry methods to address challenging thermometry problems.

The author(s) of each chapter were chosen from a group of international scientists who are experts in the field and specialist(s) on the subject matter covered in the chapter. A large number of references are included at the end of each chapter as a resource for those seeking a deeper or more detailed understanding.

This book is more than a practice guide. Readers will gain in-depth knowledge in: (1) the proper selection of the type of thermometer; (2) the best practice in using the radiation thermometers; (3) awareness of the error sources and subsequent appropriate procedure to reduce the overall uncertainty; and (4) understanding of the calibration chain and its current limitations.

• Book covers all the fundamental aspects of the radiometric measurements
• Book covers practical applications with details on the instrumentation, calibration, and error sources
• Many of the authors are from the national labs that are international leading in R&D in temperature measurements
• Comprehensive coverage with aarge number of references

A propos du livre

À propos de l?auteur

From 1993 until 2023 Benjamin Tsai worked as a physical scientist at NIST (National Institute of Standards and Technology) with research projects including the spectral irradiance scale, rapid thermal processing of semiconductor devices, heat flux, skin reflectance, UV exposure of reflectance standards, and photometry (measurement assurance program and research for luminous flux of LEDs).

Détails de l'édition

• Éditeur: Academic Press Inc
• Date d'édition: 2009
• Langue: anglais
• ISBN 10: 0123740215
• ISBN 13: 9780123740212
• Reliure: Relié
• Numéro d'édition: 1
• Nombre de pages: 376
• Éditeur: Zhang Zhuomin M., Tsai Benjamin K., Machin Graham
• Coordonnées du fabricant: non disponible
• Personne responsable: Yeepin GmbH; 492000000000; sunshine12232@outlook.com; ; Alleestr.11; Kaiserslautern; Rheinland-Pfalz; 67655; Allemagne