Articles liés à Advances in Imaging and Electron Physics
Synopsis
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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À propos de l?auteur
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 163) (Advances in Imaging and Electron Physics, Volume 163)
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Academic Press, 2010
ISBN 10 : 012381314X
ISBN 13 : 9780123813145
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Etat : Very Good. 248 pp., Hardcover, minor internal library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. N° de réf. du vendeur ZB1257699
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Advances In Imaging And Electron Physics: Volume 163 : Optics Of Charged Particle Analyzers
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ADVANCES IN IMAGING AND ELECTRON PHYSICS: VOLUME 163 : OPTICS OF CHARGED PARTICLE ANALYZERS
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Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 163) (Advances in Imaging and Electron Physics, Volume 163)
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. N° de réf. du vendeur SHAK56697
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Advances in Imaging and Electron Physics
Edité par
Elsevier Science & Technology, Academic Press, 2010
ISBN 10 : 012381314X
ISBN 13 : 9780123813145
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Englisch. N° de réf. du vendeur 9780123813145
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Advances in Imaging and Electron Physics: Volume 163: Optics of Charged Particle Analyzers (Advances in Imaging & Electron Physics)
Edité par
Academic Press 2010-09-12, 2010
ISBN 10 : 012381314X
ISBN 13 : 9780123813145
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Vendeur : Chiron Media, Wallingford, Royaume-Uni
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Hardcover. Etat : New. N° de réf. du vendeur 6666-ELS-9780123813145
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Advances in Imaging and Electron Physics : Optics of Charged Particle Analyzers
Edité par
Elsevier Science & Technology, Academic Press, 2010
ISBN 10 : 012381314X
ISBN 13 : 9780123813145
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. N° de réf. du vendeur 9780123813145
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