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Synopsis
Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.
The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
À propos de l'auteur
Dr. Milton Ohring, author of two previously acclaimed Academic Press books, The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Reliability and Failure of Electronic Materials and Devices
Edité par
Academic Press, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
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Etat : good. The item shows wear from consistent use, but it remains in good condition and works perfectly. All pages and cover are intact including the dust cover, if applicable . Spine may show signs of wear. Pages may include limited notes and highlighting. May NOT include discs, access code or other supplemental materials. N° de réf. du vendeur BVV.0125249853.G
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Reliability and Failure of Electronic Materials and Devices
Edité par
Elsevier Science & Technology, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
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Etat : Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. N° de réf. du vendeur 52864771-6
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Reliability and Failure of Electronic Materials and Devices
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Elsevier Science & Technology, Academic Press, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. Englisch. N° de réf. du vendeur 9780125249850
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Reliability and Failure of Electronic Materials and Devices
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Reliability and Failure of Electronic Materials and Devices
Edité par
Academic Press, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
Ancien ou d'occasion
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Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
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Reliability and Failure of Electronic Materials and Devices
Edité par
Elsevier Science & Technology, Academic Press, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. N° de réf. du vendeur 9780125249850
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Reliability and Failure of Electronic Materials and Devices
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Reliability and Failure of Electronic Materials and Devices
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Etat : New. In English. N° de réf. du vendeur ria9780125249850_new
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Reliability and Failure of Electronic Materials and Devices
Edité par
Academic Press, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
Ancien ou d'occasion
Couverture rigide
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
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Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 635943
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Reliability and Failure of Electronic Materials and Devices
Edité par
Elsevier Science Publishing Co Inc, US, 1998
ISBN 10 : 0125249853
ISBN 13 : 9780125249850
Neuf
Couverture rigide
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Hardback. Etat : New. Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. N° de réf. du vendeur LU-9780125249850
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