This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : Anybook.com, Lincoln, Royaume-Uni
Etat : Good. Volume 19. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,700grams, ISBN:0125330197. N° de réf. du vendeur 9701484
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Vendeur : Der Buchfreund, Wien, Autriche
OSkaibd. Etat : Sehr gut. gr8 OSkaibd. en Naturwissenschaften, Optik, Physik (Physics of Thin Films. Advances in Research and Development. Vol. 19); XV pp., 328 pp. N° de réf. du vendeur 3085
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Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Hardcover. Etat : Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book. N° de réf. du vendeur ERICA82901253301973
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