Design-For-Test for Digital Ic's & Embedded Core Systems - Couverture souple

Livre 5 sur 21: Prentice Hall Modern Semiconductor Design

Crouch, Alfred

 
9780130848277: Design-For-Test for Digital Ic's & Embedded Core Systems
Couverture souple
ISBN 10 : 0130848271 ISBN 13 : 9780130848277
Editeur : Prentice Hall, 1999

Synopsis

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l?auteur

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Prentice Hall
Date d'édition
1999
Langue
anglais
ISBN 10 
0130848271
ISBN 13 
9780130848277
Reliure
Broché
Nombre de pages
384
Coordonnées du fabricant
non disponible
Personne responsable
non disponible

Autres éditions populaires du même titre

9788131717899: Design - For - Test for Digital IC's and Embedded Core Systems

Edition présentée

ISBN 10 :  8131717895 ISBN 13 :  9788131717899
Editeur : Pearson
Couverture souple