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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces - Couverture rigide
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Book by Sarid Dror
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Présentation de l'éditeur :
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
Revue de presse :
From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.' Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.' Journal of Solid State Chemistry
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurOUP USA
- Date d'édition1994
- ISBN 10 019509204X
- ISBN 13 9780195092042
- ReliureRelié
- Nombre de pages282
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Scanning Force Microscopy With Applications to Electric, Magnetic, and Atomic Forces 5 Oxford Series in Optical and Imaging Sciences
Edité par
OUP USA
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : > 20
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Description du livre HRD. Etat : New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du vendeur L1-9780195092042
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Scanning Force Microscopy: With Applications to Electric; Magnetic; and Atomic Forces
Edité par
Oxford University Press
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : > 20
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Evaluation vendeur
Description du livre Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. N° de réf. du vendeur ria9780195092042_lsuk
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Scanning Force Microscopy With Applications to Electric, Magnetic, and Atomic Forces 5 Oxford Series in Optical and Imaging Sciences
Edité par
OUP USA
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : > 20
Vendeur :
Evaluation vendeur
Description du livre HRD. Etat : New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du vendeur L1-9780195092042
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SCANNING FORCE MICROSCOPY: WITH
Edité par
Oxford University Press
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
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Description du livre Etat : New. New. In shrink wrap. Looks like an interesting title! 1.64. N° de réf. du vendeur Q-019509204X
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EUR 208,96
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Scanning Force Microscopy (Hardcover)
Edité par
Oxford University Press Inc, New York
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : 1
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Description du livre Hardcover. Etat : new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. N° de réf. du vendeur 9780195092042
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Edité par
Oxford University Press
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
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Description du livre Etat : New. N° de réf. du vendeur ABLIING23Feb2215580031846
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Edité par
Oxford University Press
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : 1
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Description du livre Etat : New. Buy with confidence! Book is in new, never-used condition. N° de réf. du vendeur bk019509204Xxvz189zvxnew
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EUR 424,29
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Edité par
Oxford University Press
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : 1
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Evaluation vendeur
Description du livre Etat : New. New! This book is in the same immaculate condition as when it was published. N° de réf. du vendeur 353-019509204X-new
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EUR 424,29
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Scanning Force Microscopy (Hardcover)
Edité par
Oxford University Press Inc, New York
(1994)
ISBN 10 : 019509204X
ISBN 13 : 9780195092042
Neuf
Couverture rigide
Quantité disponible : 1
Vendeur :
Evaluation vendeur
Description du livre Hardcover. Etat : new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780195092042
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EUR 473,67
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