Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces - Couverture rigide

Sarid, Dror

 
9780195092042: Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces
Couverture rigide
ISBN 10 : 019509204X ISBN 13 : 9780195092042
Editeur : Oxford University Press Inc, 1994

Synopsis

This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries.

This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Revue de presse

From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.' Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.' Journal of Solid State Chemistry

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Oxford University Press Inc
Date d'édition
1994
Langue
anglais
ISBN 10 
019509204X
ISBN 13 
9780195092042
Reliure
Relié
Nombre de pages
288
Coordonnées du fabricant
non disponible
Personne responsable
Ufficio Anagrafiche Messaggerie
ufficio.anagrafiche@meli.it

Via Verdi, 8
Assago Milano
20090
Italie

Autres éditions populaires du même titre

9780195062700: Scanning Force Microscopy

Edition présentée

ISBN 10 :  0195062701 ISBN 13 :  9780195062700
Editeur : Oxford University Press Inc, 1991
Couverture rigide