The Role of Microscopy in Semiconductor Failure Analysis - Couverture souple

Richards, B. P.; Footner, P. K.

Couverture souple

ISBN 10 : 0198564325 ISBN 13 : 9780198564324

Editeur : Bios Scientific Publishers Ltd, 1992

Synopsis

This handbook describes the applications of microscopy to semiconductor failure analysis, and should be a useful practical guide for all those working in the field. The basic principles of each type of microscopy are explained, and each is illustrated with case histories and micrographs of many failure mechanisms.

Détails de l'édition

• Éditeur: Bios Scientific Publishers Ltd
• Date d'édition: 1992
• Langue: anglais
• ISBN 10: 0198564325
• ISBN 13: 9780198564324
• Reliure: Broché
• Nombre de pages: 114
• Coordonnées du fabricant: non disponible
• Personne responsable: Messaggerie Libri ; ufficio.anagrafiche@meli.it; ; Via Verdi, 8; Assago Milano; Italie