Elementary Scattering Theory: For Xray And Neutron Users - Couverture souple

Sivia, D.S.

Couverture souple

ISBN 10 : 019922868X ISBN 13 : 9780199228683

Editeur : Oxford University Press, 2011

A propos du livre

Présentation de l'éditeur

The opportunities for doing scattering experiments at synchrotron and neutron facilities have grown rapidly in recent years and are set to continue to do so into the foreseeable future. This text provides a basic understanding of how these techniques enable the structure and dynamics of materials to be studied at the atomic and molecular level. Although mathematics cannot be avoided in a theoretical discussion, the aim has been to write a book that most scientists will still find approachable. To this end, the first two chapters are devoted to providing a tutorial background in the mathematics and physics that are implicitly assumed in other texts. Thereafter, the philosophy has been one of keeping things as simple as possible.

Biographie de l'auteur

Dr. Sivia studied for his degrees at Cambridge University and then did post-doctoral work at the Los Alamos National Laboratory. He was a staff scientist at the Rutherford Appleton Laboratory, and a College Lecturer at St. Catherine's College, Oxford, for many years before becoming a Fellow of St. John's College, Oxford. In addition to the present text, he has co-authored three books on Mathematics and Physics in the Oxford Chemistry Primers Series, and a book on Bayesian Data Analysis.

Détails de l'édition

• Éditeur: Oxford University Press
• Date d'édition: 2011
• ISBN 10: 019922868X
• ISBN 13: 9780199228683
• Reliure: Broché
• Langue: anglais
• Nombre de pages: 216