9780199602247: High Energy Electron Diffraction and Microscopy
Couverture souple
ISBN 10 : 0199602247 ISBN 13 : 9780199602247
Editeur : Oxford University Press, 2011

Synopsis

This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.

Biographie de l'auteur

L.-M. Peng, Yangtze Professor of Nanoscale Science and Technology at Peking University; elected Fellow of Institute of Physics in 2000 and awarded the Qiu Shi Prize for Outstanding Young Scientist in Physics in 1998. Currently serves as an Associate Editor of the "International Journal of Nanoscience", a member of the Advisory Editorial Board of Ultramicroscopy and a member of the Editorial Board, MICRON. S.L.Dudarev, Principal Scientist at EURATOM/UKAEA Fusion Association and Senior Research Fellow of Linacre College, Oxford. Received DSc in Theoretical and Mathematical Physics from Moscow Engineering Physics Institute in 1994. Held visiting positions at Melbourne University, Max-Planck Institute for Solid State Research in Stuttgart and Hong-Kong Polytechnic University. Currently involved in the development of a comprehensive programme on mathematical modelling of fusion materials. M.J.Whelan, FRS, Emeritus Professor of Microscopy of Materials in the Department of Materials, Oxford University. Emeritus Fellow of Linacre College, Oxford.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Oxford University Press
Date d'édition
2011
Langue
anglais
ISBN 10 
0199602247
ISBN 13 
9780199602247
Reliure
Broché
Nombre de pages
560
Coordonnées du fabricant
non disponible
Personne responsable
Messaggerie Libri
ufficio.anagrafiche@meli.it

Via Verdi, 8
Assago Milano
Italie

Autres éditions populaires du même titre

9780198500742: High Energy Electron Diffraction and Microscopy

Edition présentée

ISBN 10 :  0198500742 ISBN 13 :  9780198500742
Editeur : Oxford University Press, 2004
Couverture rigide