Synopsis
The digital edition of all books may be viewed on our website before purchase. Excerpt from Two-Fluid Measurements on Thin Films
About the Publisher
Forgotten Books publishes hundreds of thousands of rare and classic books.
This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works. This text has been digitally restored from a historical edition. Some errors may persist, however we consider it worth publishing due to the work's historical value.The digital edition of all books may be viewed on our website before purchase.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Autres éditions populaires du même titre
Résultats de recherche pour Two-Fluid Measurements on Thin Films (Classic Reprint)
Image fournie par le vendeur
Two-Fluid Measurements on Thin Films (Classic Reprint)
impression à la demandeVendeur : Forgotten Books, London, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
Paperback. Etat : New. Print on Demand. This book introduces an efficient method for calculating two-fluid measurements on thin films. The main goal is to help scientists determine the dielectric constant of a material without dealing with thickness issues that can result in inaccurate readings. The dielectric constant of a film is a crucial parameter for understanding its electrical behavior, but its calculation can be challenging due to the film's thinness and the need for precise measurements. Unlike conventional methods that rely on sample thickness estimation, this technique offers a more accurate approach. The author provides detailed guidance on the experimental setup, measurement procedures, and data analysis, making it accessible to researchers and engineers working with thin films. The significance of this book lies in its ability to enhance the accuracy of dielectric constant measurements, which is essential for advancing research in materials science and microelectronics. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N° de réf. du vendeur 9780260717276_0
Acheter neuf
EUR 15,40
Livraison gratuite
Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
Quantité disponible : Plus de 20 disponibles