Journey to Data Quality - Couverture rigide

Pipino, Leo L.; Wang, Richard Y.; Funk, James D.; Lee, Yang W.

Couverture rigide

ISBN 10 : 0262122871 ISBN 13 : 9780262122870

Editeur : The MIT Press, 2006

Synopsis

A guide for assessing an organization's data quality practice and a roadmap for implementing a viable data and information quality management program, based on rigorous research and drawing on real-world examples.

All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems leve—installing the latest software or developing an expensive data warehouse—solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program. This practical guide, based on rigorous research and informed by real-world examples, describes the challenges of data management and provides the principles, strategies, tools, and techniques necessary to meet them. The authors, all leaders in the data quality field for many years, discuss how to make the economic case for data quality and the importance of getting an organization's leaders on board. They outline different approaches for assessing data, both subjectively (by users) and objectively (using sampling and other techniques). They describe real problems and solutions, including efforts to find the root causes of data quality problems at a healthcare organization and data quality initiatives taken by a large teaching hospital. They address setting company policy on data quality and, finally, they consider future challenges on the journey to data quality.

A propos du livre

À propos de l?auteur

Leo L. Pipino is Professor Emeritus of Management Information Systems at the University of Massachusetts, Lowell.

Richard Y. Wang is Director of the MIT Information Quality Program (MITIQ), Codirector of the Total Data Quality Management Program at MIT (MIT TDQM), and University Professor at the University of Arkansas at Little Rock, where the first master's degree program in Information Quality has been established.

James D. Funk is Founder and Chief Information Architect at Beyond Accuracy, LLC.

Yang W. Lee is Associate Professor at the Information, Operations, and Analysis Group in the College of Business Administration at Northeastern University.

Détails de l'édition

• Éditeur: The MIT Press
• Date d'édition: 2006
• ISBN 10: 0262122871
• ISBN 13: 9780262122870
• Reliure: Relié
• Langue: anglais
• Nombre de pages: 240
• Coordonnées du fabricant: non disponible