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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint) - Couverture souple
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The digital edition of all books may be viewed on our website before purchase. Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)
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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works. This text has been digitally restored from a historical edition. Some errors may persist, however we consider it worth publishing due to the work's historical value.The digital edition of all books may be viewed on our website before purchase.
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EUR 1,06 expédition depuis Etats-Unis vers France
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)
Vendeur : PBShop.store US, Wood Dale, IL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LW-9780266745884
Quantité disponible : 15 disponible(s)
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)
Vendeur : PBShop.store UK, Fairford, GLOS, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LW-9780266745884
Quantité disponible : 15 disponible(s)
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Methods of Measurement for Semiconductor Materials, Process Control, and
impression à la demandeVendeur : Forgotten Books, London, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : New. Print on Demand. This book, spanning semiconductor materials, process control, and device properties and measurements, presents innovative methods for characterizing these elements in the context of semiconductor fabrication. It is a trusted guidebook covering resistivity, carrier lifetime, and inhomogeneity measurements for semiconductor materials. The author also delves into wire bond evaluation, die attachment, thermal properties, and microwave device measurements, providing valuable insights for professionals in semiconductor manufacturing and research. The measurement and characterization techniques explored in this book pave the way for improved device performance and reliability, making it an essential resource for advancing semiconductor technology. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N° de réf. du vendeur 9780266745884_0
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