Electron Energy-Loss Spectroscopy in the Electron Microscope - Couverture rigide

Egerton, Ray

Couverture rigide

ISBN 10 : 0306421585 ISBN 13 : 9780306421587

Editeur : Kluwer Academic / Plenum Publishers, 1995

Synopsis

Electron energy-loss spectroscopy (EELS or ELS) has been used to investi- gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro- scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand- ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con- tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their own spectrometer or electron-detection system. Chapter 3 outlines the theory used to interpret spectral features, while Chapter 4 gives procedures for numerical processing of the energy-loss spectrum. Chapter 5 contains examples of practical applications of EELS and a discussion of radiation damage, spatial resolution, and detection limits.

Détails de l'édition

• Éditeur: Kluwer Academic / Plenum Publishers
• Date d'édition: 1995
• Langue: anglais
• ISBN 10: 0306421585
• ISBN 13: 9780306421587
• Reliure: Relié
• Nombre de pages: 422
• Coordonnées du fabricant: non disponible
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