Articles liés à Scanning Electron Microscopy, X-Ray Microanalysis,...
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook - Couverture souple
Synopsis
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Acheter neuf
Afficher cet article
EUR 102,32
EUR 2,27 expédition vers Etats-Unis
Destinations, frais et délais
Résultats de recherche pour Scanning Electron Microscopy, X-Ray Microanalysis,...
Image d'archives
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Edité par
Springer, 1990
ISBN 10 : 0306435918
ISBN 13 : 9780306435911
Ancien ou d'occasion
Paperback
Vendeur : HPB-Red, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_395557394
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 658409-n
Quantité disponible : Plus de 20 disponibles
Image d'archives
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy (Paperback)
Edité par
Springer Science+Business Media, Dordrecht, 1990
ISBN 10 : 0306435918
ISBN 13 : 9780306435911
Neuf
Paperback
Vendeur : Grand Eagle Retail, Mason, OH, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : new. Paperback. During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780306435911
Quantité disponible : 1 disponible(s)
Image d'archives
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur ABLIING23Feb2215580098665
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook
Edité par
Springer, 1990
ISBN 10 : 0306435918
ISBN 13 : 9780306435911
Ancien ou d'occasion
Couverture souple
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 658409
Quantité disponible : Plus de 20 disponibles
Image d'archives
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. In. N° de réf. du vendeur ria9780306435911_new
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 658409-n
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
impression à la demandeVendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in 'hands-on' learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized. 424 pp. Englisch. N° de réf. du vendeur 9780306435911
Quantité disponible : 2 disponible(s)
Image d'archives
Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy
Edité par
Springer Science+Business Media, 1990
ISBN 10 : 0306435918
ISBN 13 : 9780306435911
Neuf
Couverture souple
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. Num Pages: 407 pages, 133 black & white illustrations. BIC Classification: PSC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 246 x 302 x 25. Weight in Grams: 726. . 1990. Paperback. . . . . N° de réf. du vendeur V9780306435911
Quantité disponible : 15 disponible(s)
Image fournie par le vendeur
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Edité par
Springer US, 1990
ISBN 10 : 0306435918
ISBN 13 : 9780306435911
Neuf
Kartoniert / Broschiert
Vendeur : moluna, Greven, Allemagne
Évaluation du vendeur 4 sur 5 étoiles
Kartoniert / Broschiert. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beam. N° de réf. du vendeur 5901718
Quantité disponible : Plus de 20 disponibles