Scanning Electron Microscopy and X-Ray Microanalysis - Couverture rigide

Newbury, Dale E.; Kchlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R.

Couverture rigide

ISBN 10 : 0306472929 ISBN 13 : 9780306472923

Editeur : Kluwer Academic/Plenum Publishers, 2003

Synopsis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

A propos du livre

À propos de l'auteur

This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.

Détails de l'édition

• Éditeur: Kluwer Academic/Plenum Publishers
• Date d'édition: 2003
• Langue: anglais
• ISBN 10: 0306472929
• ISBN 13: 9780306472923
• Reliure: Relié
• Numéro d'édition: 3
• Nombre de pages: 689
• Éditeur: Goldstein Joseph I.
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3,69115 Heidelberg, Germany; Heidelberg; 69115; Allemagne