Scanning Electron Microscopy and X-Ray Microanalysis - Couverture rigide

Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.

Couverture rigide

ISBN 10 : 0306472929 ISBN 13 : 9780306472923

Editeur : Kluwer Academic/Plenum Publishers, 2003

Synopsis

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.

A propos du livre

À propos de l'auteur

This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.

Détails de l'édition

• Éditeur: Kluwer Academic/Plenum Publishers
• Date d'édition: 2003
• Langue: anglais
• ISBN 10: 0306472929
• ISBN 13: 9780306472923
• Reliure: Relié
• Numéro d'édition: 3
• Nombre de pages: 708
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3,69115 Heidelberg, Germany; Heidelberg; 69115; Allemagne