Statistical Regression With Measurement Error - Couverture rigide

Ness, John W.Van; Cheng, Chi-Lun

Couverture rigide

ISBN 10 : 0340614617 ISBN 13 : 9780340614617

Editeur : Hodder Arnold, 1999

Synopsis

Covering the field of statistics called measurement error models, this work includes a full discussion of functional and structural models as well as the more general ultrastructural model. The material is presented at a level appropriate for beginning graduate students and includes problems at the end of each chapter to aid learning. Computational methods are considered, and the rationale is to provide an intermediate level survey of the field of measurement error models without too much mathematical detail. Topics covered include: model identifiability; parameter estimation; confidence intervals; asymptotic theory; finite sample properties; orthogonal regression; modified lease squares methods; instrumental variable methods; the linear and non-linear Berkson Model; calibration; and computational methods.

A propos du livre

Présentation de l'éditeur

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem–proof format.

Détails de l'édition

• Éditeur: Hodder Arnold
• Date d'édition: 1999
• Langue: anglais
• ISBN 10: 0340614617
• ISBN 13: 9780340614617
• Reliure: Relié
• Nombre de pages: 256
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible